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Stuck-at-fault test set compaction

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dc.creator Vanfickell, Jason Michael en_US
dc.date.accessioned 2013-02-22T20:41:52Z
dc.date.available 2013-02-22T20:41:52Z
dc.date.created 2004 en_US
dc.date.issued 2013-02-22
dc.identifier.uri http://hdl.handle.net/1969.1/ETD-TAMU-2004-Fellows-Thesis-V36 en_US
dc.description Due to the character of the original source materials and the nature of batch digitization, quality control issues may be present in this document. Please report any quality issues you encounter to digital@library.tamu.edu, referencing the URI of the item. en_US
dc.description Includes bibliographical references (leaf 21). en_US
dc.description.abstract Proper testing of manufactured digital circuits is critical to ensuring the number of defective parts is minimized. Automated test pattern generation tools are created in order to produce test patterns that can be applied with the intention of identifying as many defective parts as possible. The increasing complexity of digital circuit designs causes this task to continue to increase in difficulty. At the same time, the amount of time dedicated to testing should be kept constant. Therefore, it is crucial to limit the number of test patterns that are applied to any given circuit. Additionally, tester memories may limit the number of test patterns that may be applied at one time. This research demonstrates several existing methods of compaction and introduces a new method for measuring the contribution of each test pattern. Both static and dynamic compaction methods were implemented and evaluated in terms of final test pattern set size and diversity of excitation. The program resulting from this research has been shown to equal or surpass an existing automated test pattern generation tool. en_US
dc.format.medium electronic en_US
dc.format.mimetype application/pdf en_US
dc.language.iso en_US en_US
dc.publisher Texas A&M University en_US
dc.rights This thesis was part of a retrospective digitization project authorized by the Texas A&M University Libraries in 2008. Copyright remains vested with the author(s). It is the user's responsibility to secure permission from the copyright holder(s) for re-use of the work beyond the provision of Fair Use. en_US
dc.subject computer engineering. en_US
dc.subject Major computer engineering. en_US
dc.title Stuck-at-fault test set compaction en_US
thesis.degree.department computer engineering en_US
thesis.degree.discipline computer engineering en_US
thesis.degree.name Fellows Thesis en_US
thesis.degree.level Undergraduate en_US
dc.type.genre thesis en_US
dc.type.material text en_US
dc.format.digitalOrigin reformatted digital en_US


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